Sensor Plasmônico Krestschmann Baseado em Grafeno na faixa de Terahertz

This paper proposes a graphene-based terahertz plasmatic refractive index sensor. The configuration used is Kretschmann, where the chemical potential is the variable that monitors the reflectivity. The sensor was analyzed theoretically by the two-dimensional finite element method, where reflectivity and field distributions were calculated for different parameters. First, a study was done to determine the best operating frequency, incidence angle and minimum sample thickness. After, the sensitivity, bandwidth and resolution were analyzed, with mean values obtained 0,312 eV/RIU, 0,03399 eV and 0,0106 RIU, respectively.