Análise Paramétrica do Modelo LE-FDTD para Dispositivos Eletrônicos Discretos

In this work, a model for lumped electronic devices based on the LE-FDTD method is implemented and the accuracy of this method is studied in comparison with SPICE models. The developed model validation is done by comparing the results of electric field and voltage across the devices obtained by the FDTD method with the same results from SPICE simulations. This comparison is based on the Euclidean norm evaluation for these results in order to find the error between them. Subsequently, an optimization technique is applied to find the Yee cell size that leads to the minimum error.